Nbs Part I - Overview Of DC/LOW Frequency Measurements & Standard
Author(s): Norman B. Belecki
Abstract/Introduction:
After the introduction to the Electricity Division of the National Bureau of Standards - its goals, resources and recent accomplishments - the talk will focus on its current research work in the area of DC - LF measurements and standards.
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Document ID:
4B7BB28A
Examining The Role Of The Commercial Calibration Laboratory
Author(s): Howard R. Patterson
Abstract/Introduction:
The assurance of quality products and services, which involves precision measurement, is one of the most important juetifications for good maintenance and calibration programs. An independent commercial calibration laboratory can Supply this necessary assurance in a most expedient, unbiased and economical way.
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Document ID:
50557929
Mobile Calibration Van
Author(s): James W. Morton
Abstract/Introduction:
To meet the calibration requirements of electronic test equipment users in their environment, a Mobile Calibration Van was designed and equipped with transfer standards to provide a high measurement accuracy in most electronic disciplines. The capability for measuring AC/DC Voltage, AC/DC Current, Resistance, RF Power, Attenuation, Modulation Levels, Frequency, VSWR, VOR Zero, Rise Time, Pulse Width, Peak Power and Distortion is available utilizing the best available measurement equipment standards. Calibration work will be performed in accordance with MIL-Q-9858A and MIL-C-45662A.
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Document ID:
3F4EEEBF
Microinch Mjzasuremfants
Author(s): Wright K. Huntley, Jr.
Abstract/Introduction:
Calibration labs have faced the problems of microinch measurements for many years, and the requirements of the rule of ten and traceability have generated equipment and methodology suitable for occasional checking of gages to accuracies of one or two millionths of an inch.* About ten years ago, the requirements of high-density-magnetic-storage devices and largescale integrated circuits created a new set of problems. For the first time, volume production of complex products required routine, often lOO%, inspection in the low millionths. Hundreds of measuring systems have been assembled to provide a millionths equivalent to what the coordinate-measuring machines have done for measuring thousandths. The objective has been to speed up inspection and reduce the required level of operator skill, while avoiding the hazards of errors introduced by thermal effects, mechanical deflection, vibration, dirt, looseness, and wear. Unfortunately, most of these new machines dont work terribly well, they are rarely--if ever-- calibrated, and they evolved outside the traditional world of measuring-machine design
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Document ID:
ED0DF412
Energy Conservation By Use Of Portable Temperature Instruments
Author(s): Willlam Wahl
Abstract/Introduction:
The purpose of this report is to review PORTABLE TEMPERATURE INSTRUMENTS and where they can most effectively assist energy and process managers. Temperature is the key signal to energy conservation, and indicates conditions that are either normal or out of limits.
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Document ID:
BBD3D53D
Heat Inspection Instrumentation
Author(s): Robert F. Friedman
Abstract/Introduction:
One of the actions for energy conservation is thermal inspection. Present and future challenges in the energy-short environment dictate this requirement.
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Document ID:
165C90B1
Configuring, Using & Troubleshooting Measuring Systems On The IEEE-488 Bus
Author(s): John L. Mimk
Abstract/Introduction:
The rapidly increasing use of the IEEE-468 bus to configure automatic measuring mini-systems is resulting in some practical problems in factories, labs, and other facilities. The use of instruments from a variety of manufacturers may further complicate the problem.
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Document ID:
E060B3E1
Serviceability And Troubleshooting Of Microprocessor - Based Instruments
Author(s): Hatch, Robert I
Abstract/Introduction:
It is believed that microprocessor control complicates servicing and troubleshooting procedures of instruments. In several cases this is true. however, methods are available facilitating these problems they have to be designed in and can consist of either selftest programs or defined states provided by the operational program. The capability to functionally isolate circuits is the most significant of these built-in methods. Conventional troubleshooting techniques with the help of thorough documentation are by no means obsolete, however, the larger magnitude of data to be gather with microprocessor controlled instruments causes more complex problems.
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Document ID:
C84B6B80
Microprocessor Controlled Phase Indicator For Vor
Author(s): Albert E. Wesley, Howard F. Garrison, Edward m. Cooper III
Abstract/Introduction:
A new VOR phase indicator is capable of demodulating and extracting the bearing information from a complex VOR audio signal. This microprocessor-based instrument displays VOR bearing over the range 0 to 359.99. The unit has provision for an input signal monitor, an automatic self check, and an automatic zeroing feature which improves accuracy and lengthens the calibration cycle.
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Document ID:
D6A3B8F5
Microprocessor Based Timer-Counter
Author(s): Arch W. Conway
Abstract/Introduction:
THIS PAPER SHOWS THAT THROUGH JUDICIOUS USE OF A MICRO-PROCESSOR, A UNIVERSAL TIMER-COUNTER HAS BEEN ECONOMICALLY DEVISED, WHICH IN ADDITION TO HAVING ALL OF THE TRADITIONAL TIMER-COUNTER CAPABILITIES, IS ABLE TO COMMUNICATE WITH A VARIETY OF INTERFACES AS WELL AS HAVING SEVERAL UNIQUE OPERATOR ORIENTED FEATURES.
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Document ID:
DBAACD8E
A Second Industrial Revolution: Automated, Low-Labor-Cost Maintenance (STANDARDS/CALIBRATION/REPAIR)
Author(s): Loebe Julie
Abstract/Introduction:
THE TECHNOLOGICAL ADVANCES OF THE INDUSTRIAL REVOLUTION BROUGHT ABOUT A TEN-FOLD REDUCTION, THE WHOLE RANGE AND VARIETY OF MODERN MANUFACTURED PRODUCTS WAS MADE AVAILABLE, AND ALL OF THESE PRODUCTS CAN BE OBTAINED AT EXTREMELY LOW INITIAL PURCHASE PRICES RELATIVE TO THEIR COMPLEXITY.
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Document ID:
BD4D4DB5
Microprocessor Based Interfaces For Test And Measurement Equipment
Author(s): Earl Hicks, Darrell Dederich
Abstract/Introduction:
Equipment interface incompatibility is a common problem encountered in configuring test systems. The need arises to find a common medium between various digital data and control formats such as the IEEE-488 bus, BCD, etc. and analog control signals. This discussion describes an application where a microprocessor was implemented to serve as such a medium in a production test system for space-qualified atomic clocks. The Motorola MEK6800D2 evaluation kit was used to develop the microprocessor program and was integrated into the hardware to minimize system development costs.
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Document ID:
A63AF9DE
Microcomputer Testing Of Lsi Microcircuits
Author(s): James H. Lindwedel
Abstract/Introduction:
In 1977, two screen test techniques were investigated at Rockwell International for detecting oxide defects in large-scale integrated (LSI) circuits. This paper describes the results of applying those techniques and the details of continuous microcomputer tests performed. This paper should be of interest to those who want to learn about microcomputer testing of components.
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Document ID:
47809BA2
A Low-Cost, Versatile Instrument For Debugging Ieee 488 Std. Bus Interface Systems
Author(s): Henri Schaufelberger
Abstract/Introduction:
With the ever-increasing supply of IEEE 488 Std. Bus-compatible instruments, it is becoming very easy for anyone to configure his own modular test system, tailored exactly to his specific needs. What does he do if the system does not work as expected? How does he find out whether the problem is hardware- or softwarerelated?
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Document ID:
3A70FEB8
Nbs Part 2 - Overview Of Electromagnetic Measurements And Standards
Author(s): Dr. Robert Kamper
Abstract/Introduction:
NBS OFFERS MEASUREMENT AND CALIBRATION SERVICES FOR THE QUANTITIES THAT CHARACTERIZE RF AND MICROWAVE TRANSMISSION LINE SYSTEMS, SUCH AS POWER ATTENUATION, INPEDANCE, ETC. AS WELL AS FOR THE CHARACTERISTICS OF ANTENNAS, THE WAVEFORM OF IMPULSE GENERATORS, AND THE POWER AND ENERGY OF LASERS.
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Document ID:
42F933A8
Calibration Laboratory Automation
Author(s): Loebe Julie
Abstract/Introduction:
THE MECCA PROGRAM IS A SYSTEMS APPROACH TO THE DEVELOPMENT OF EQUIPMENT AND TECHNIQUES FOR THE IMPROVEMENT OF FLEET TEST EQUIPMENT READINESS. IT IS AN INVENTION MOTHERED BY THE NECESSITY TO RESPOND TO EVER GROWING FLEET CALIBRATION SUPPORT PROBLEMS THAT THREATENS TO EXCEED THE FORECAST RESOURCES OF THE NAVY.
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Document ID:
9F08982C
Operational Scenario Of The Mecca Systems
Author(s): Dick Calhoun
Abstract/Introduction:
The report is a definitive description of the operational features of the controller for . the MJWCA Systems. The report is a design to effectively implement the means of programming the present and future calibration measurement/ stimulus units. The operation stresses the ability of the MECCA controller to train and prompt the operator to take the required actions without significant prior knowledge of the operation.
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Document ID:
858A9F32
Multifunction Calibrators
Author(s): Thor Chellstorp
Abstract/Introduction:
The digital voltmeter and multimeter have largely displaced the VOM and the VTVM. At the same time, more and more instrument calibration is being automated. And whether manual or automated, there is a continuing need to reduce calibration costsi This has created a need for calibrators that can provide the accuracies, band-widths, and multiple functions demanded by 3 l/2 and 4 l/2 digit DMMs, that can be used in automated calibration systems, that have features to speed calibration, reduce operator errors, etc., and thus lower costs, and still calibrate a majority of the older instruments. The Fluke 5100 Series Calibrators were designed to fulfill these needs.
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Document ID:
92142E5E