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Title: Microprocessor Based Interfaces For Test And Measurement Equipment
Author: Earl Hicks, Darrell Dederich
Source: 1977 Measurement Science Conference
Year Published: 1977
Abstract: Equipment interface incompatibility is a common problem encountered in configuring test systems. The need arises to find a common medium between various digital data and control formats such as the IEEE-488 bus, BCD, etc. and analog control signals. This discussion describes an application where a microprocessor was implemented to serve as such a medium in a production test system for space-qualified atomic clocks. The Motorola MEK6800D2 evaluation kit was used to develop the microprocessor program and was integrated into the hardware to minimize system development costs.




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