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Title: Microcomputer Testing Of Lsi Microcircuits
Author: James H. Lindwedel
Source: 1977 Measurement Science Conference
Year Published: 1977
Abstract: In 1977, two screen test techniques were investigated at Rockwell International for detecting oxide defects in large-scale integrated (LSI) circuits. This paper describes the results of applying those techniques and the details of continuous microcomputer tests performed. This paper should be of interest to those who want to learn about microcomputer testing of components.

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