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Title: Risk-Based Control Limits
Author: Howard Castrup
Source: 2001 Measurement Science Conference
Year Published: 2001
Abstract: A methodology is presented for the development of SPC control limits for measurement processes. The methodology employs both Bayesian and traditional measurement decision risk concepts to establish control limits that flag whether measuring processes are in or out of control relative to the specifications of the artifacts they measure. The methodology has particular relevance for calibration and testing.

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