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Title: Capacitance Measurement Assurance Program Map()
Author: Y. May Chang
Source: 1993 Measurement Science Conference
Year Published: 1993
Abstract: This paper describes the recently developed capacitance Measurement Assurance Program (MAP) service at the National Institute of Standards and Technology (NIST). Using a commercial digital capacitance meter as the transport standard, two separate pilot programs for the capacitance MAP have been carried out for standards at both the 1000 pF and 100 pF levels. The first was carried out as a single transfer with a government standards laboratory, and the second was designed for round-robin measurements as a multiple transfer by three industrial standards laboratories.

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