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Title: Bit, Bite And Testability
Author: Mark Kaufman
Source: 1982 Measurement Science Conference
Year Published: 1982
Abstract: The increased use of microprocessors, LSI and VLSI allows test systems, regardless of size, to do more and do it faster than ever before. The cutting edge of this technological sword has made many new systems and techniques possible. Complex waveforms are generated and analyzed by portable instruments that were impossible a few years ago. Unfortunately, this wonderful sword is double edged the costs of these rapid advances are mounting. For example, fifteen years ago, hardware/ software integration problems were only encountered in mainframe computers. Today, nearly every new instrument has had to go through a series of software/hardware integration problems. Even the rather mundane musical doorbells have had these problems. In addition to many new problems, one other cost has been a large change in the value of electronic systems. Since each new system can do more, it has more value. This does not necessarily mean that each new system is more expensive although this is often the case, just that more areas are impacted when something goes wrong. Another problem rapid technological advances have generated is a drastic change in the resources required. Vacuum tube experts are no longer in demand, but engineers who can resolve hardware/software problems are. Even if man-hour costs remain steady, downtime costs are increasing because of the increases in the value of a system. One of the responses to the new generation of problems is to.design testability into a system to minimize downtime. Two of the methods often chosen are to use built-in-test, BIT, and builtin- test-equipment, BITE. Real world solutions also generate real world problems, and the use of BIT/BITE is no exception

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