Email Document Reference

Enter your email address below and the reference for this document will be sent to shortly from webmaster@ceesi.com.

Title: Cmm Standards, Software And SPC Dmis Impact On Quality And Productivity
Author: Valerie Gas, Ted Doiron, Robert Hocken, Steven Phillips B. Borchardt
Source: 1991 Measurement Science Conference
Year Published: 1991
Abstract: The Dlmenslonal Measuring Interface Specification, DMIS,version 2.1, states that the objective of DMIS Is to provide a standard for the bldirectlonal communication ofinspection data between computer systems and Inspection equipment. DMIS 2.1 is an American National Standard. It Is appearing on more and more measuring machines and computer alded deslgn systems. Will DMIS Improve quality? Will it Improve productlvlty? To evaluate the effect of DMIS, lets consider the benefits and drawbacks of DMIS In these four areas:

In order to prevent spam and automated file downloads for documents within the Measurement Library, please follow the instructions below and then you will be able to email a reference to this article.