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Title: Coordinate Measuring Machine Calibration Artifact Design And Metrology
Author: J.R. Barr
Source: 1990 Measurement Science Conference
Year Published: 1990
Abstract: The quality of a Coordinate Measuring Machine (CMM) calibration process depends on complete metrology system concepts. The potential sources for error in the CMM can be evaluated using a length standard artifact. The standard artifact evaluates the probe or optical head/software subsystem as well as accuracy in one, two or three dimensional space. The artifact elements are designed to fit the CMM measuring system and the system for the calibration of the artifact.

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