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Title: Special Topics In SPC Of Measurement
Author: Phil Stein
Source: 2004 Measurement Science Conference
Year Published: 2004
Abstract: The SPC (Shewhart) control chart has wide and powerful applications in measurements and calibration. Most metrology practitioners know this in principle, but dont use charts because they dont know which ones to use, or exactly how to make or interpret them. This talk will answer all these questions and more from a technical perspective, and will also discuss why SPC is so important in measurements.

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