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Title: The Application Of Low Noise Switches For Automating Precision Measurements
Author: James Marshall
Source: 1987 Measurement Science Conference
Year Published: 1987
Abstract: A switching system which has very low thermal EMFs (less than 50 nanovolts) and protection systems which allow the automating of standard cell comparisons was described at the 1984 Measurement Science Conference. This same switch is being used to automate other critical measurements in the standards laboratory such as the comparison between 10 volt solid state voltage references and standard cells, standard resistance comparisons and temperature calibrations. This paper will review several of these applications showing the setups used and typical results that are obtained.

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