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Title: Diode Lasers In Length Metrology: Application To Absolute Distance Interferometry
Author: Jack A. Stone, Alois Stejskal, Lowell Howard
Source: 1999 Measurement Science Conference
Year Published: 1999
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of our research on the use of diode lasers in ADI and we discuss, more generally, the unique strengths and weaknesses of diode lasers for dimensional metrology. In selected applications the capabilities of the diode can provide significant advantages.

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