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Title: SPC Applications In Metrology
Author: Bernard Warchuck Jr., Ravi K. Dhar, Henriequs Koeman, John Larson, Steven Cook
Source: 1992 Measurement Science Conference
Year Published: 1992
Abstract: In todays competitive environment, organizations must be dedicated to the never ending task of continuous improvement associated with improving the control and management of its processes and systems. They must continually find better ways of doing everyday tasks in order to take advantage of each opportunity to reduce costs and improve the quality of work performance. Toward that end, SPC is a powerful tool that can be utilized to the fullest extent possible not only in manufacturing processes, but in administrative processes as well.

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