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Title: Missile Test Confidence Via Test Systems Certification And Associated Data Analysis
Author: David Maupin
Source: 2004 Measurement Science Conference
Year Published: 2004
Abstract: This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. I will look at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.

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