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Title: Virtual Instrumentation For Metrology Applications
Author: Gregory Smith
Source: 2002 Measurement Science Conference
Year Published: 2002
Abstract: Computer-based instruments in the 3U PXI form factor are ideal for use as test equipment in a variety of metrology applications. Through the use of various software front-ends, these PXI computer-based instruments can be adapted to accommodate a number of measurement challenges. This presentation reviews what the relative advantages of computer-based virtual instrumentation are, how 3U PXI fits in, what PXI is, and what the various software front-ends in the industry are that take full advantage of these resources.

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