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Title: Application Of The NIST Testing Strategies To A Multirange Instrument
Author: A. D. Koffman, T. m. Souders
Source: 1994 Measurement Science Conference
Year Published: 1994
Abstract: A new modeling and test point reduction technique for analog and mixedsignal devices has been developed at the National Institute of Standards and Technology (NIST). This technique has been applied as a case study to a manufacturers thermal transfer standard for potential use in testing and calibration. An empirical model is formulated using complete test data from many devices collected from several production runs. The model is then algebraically reduced using singular value decomposition and QR decomposition. Once the fmal reduced model is obtained, it is used to test devices which are measured only at a reduced set of test points. The model allows accurate prediction of device behavior at all other test points. Techniques for optimal model size selection are discussed. Device modeling results are presented and compared to complete test data.

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