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Title: Cmm Touch Probe Vs Scanning
Author: Stephen A. Long
Source: 2011 Measurement Science Conference
Year Published: 2011
Abstract: This paper will discuss the benefits and pitfalls of various methods of Coordinate Measurement Machine (CMM) probing, and the pros and cons of each. The data has been collected over several years of actual evaluations performed in industry and laboratory experimentation. As the CMM industry embraces full contact and non contact scanning methods, the benefits become clear, but still have various pitfalls in their metrology.

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