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Title: Rf And Microwave Metrology
Author: A. Golub, S. Richard, D. Nagle, Brian Sequeira, Gerome Reeve
Source: 1992 Measurement Science Conference
Year Published: 1992
Abstract: Dielectric measurements have been made at microwave frequencies on Corderite, Sodium Aluminate, Sodium Zirconate, and Sodium Titanate between -196C and +536OC and on Yttrium-stabilized Zirconia at room temperature and at 600 C. The method used is a one-port technique that was presented in previously published work l-3 and is now commercially available 4. We report here on the special considerations pertaining to microwave measurements of dielectric properties that are sensitive functions of temperature -- specifically, sample holder design, reference plane extension, and sample stability and preparation. We also discuss improvements that have enhanced accuracy and increased throughput from one measurement per 8-hour day to three measurements per hour.

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