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Title: Closing The Loop On Embedded Software Testing
Author: Alex Dorchak
Source: 1996 Measurement Science Conference
Year Published: 1996
Abstract: In a modern T&M instrument, increased functionality and accuracy requirements are mirrored internally by more computing power and more sophisticated state sequencing. Relays, switches, and other software controllable devices, such as DACs, must be transitioned in a precise order to a precise state to reach the desired instrument function, range, and value. The testing of this internal sequencing has become extraordinarily complex.

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