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Title: Transient Lightning Protection For Electronic Measurement Devices
Author: Patrick S. Mccurdy
Source: 2004 International School of Hydrocarbon Measurement
Year Published: 2004
Abstract: Technology advances in the world of semiconductors and microprocessors are increasing at a breathtaking pace. The density of transistor population on integrated circuits has increased at a rate unimaginable just a few years ago. The advantages are many: faster data acquisition, real time control, and fully automated factories, to name a few. Semiconductor technology is also prevalent in field mounted instrumentation and electronic measurement devices. Unfortunately, a tradeoff to the increased performance is the susceptibility of these semiconductor devices to voltage and current transient events. The minimum results are unreliable instrumentation readings and operation, with periodic failures. The worst case result is a completely destroyed measurement device. Such power surges are often the work of mother nature. Lightning, which according to the National Weather Service strikes some 40 million times annually in the U.S., is a leading cause of failure in electronic measurement devices. When these devices are field mounted the vulnerability greatly increases due to their remote location and outdoor installation. It should be noted that although the most devastating source of transient voltage and current activity is lightning, there are other sources. Some of these include static buildup, human error, inductive load switching, and utility capacitor switching. This paper explores lightning effects on electronic measurement devices, and methodologies for preventing damage including lightning arrester technology, shielding, grounding and surge protection devices (SPD). The discussion will also cover various coupling methods for transients, and national and international standards that can help in evaluation and application of the proper surge protection network.

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