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Title: The Impact Of A New Noise Figure Meter On Microwave Metrology
Author: John Minck
Source: 1982 Measurement Science Conference
Year Published: 1982
Abstract: MICROPROCESSOR TO THE RESCUE John Minck Applications Engineer Stanford Park Division Hewlett-Packard Company P&1( Alt.0, California In December 1981, the world of noise figure measurements changed, we think, for the better. A new noise figure meter was introduced then offering higher accuracy and measurement flexibility. This meter will make measurements easier but it will also require increased accuracies in the ENR (Excess Noise Ratio) traceabilities of the microwave metrology lab. Luckily, the new meter can also be used to transfer ENR easily in the cal lab.

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