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Title: Learning To Apply Metrology Principles To The Measurement Of X-Ray Intensities In The 500 Ev To 110 Kev Energy Range
Author: Michael J. Haugh, Travis Pond, Christopher Silbernagel, Peter Torres, Kent Marlett, Fletcher Goldin, Susan Cyr
Source: 2011 Measurement Science Conference
Year Published: 2011
Abstract: National Security Technologies, LLC (NSTec), Livermore Operations, has two optical radiation calibration laboratories accredited by the National Institute of Standards and Technology (NIST), and is now working towards accreditation for its X-ray laboratories. NSTec operates several laboratories with X-ray sources that generate X-rays in the energy range from 50 eV to 115 keV. These X-ray sources are used to characterize and calibrate diagnostics and diagnostic components used by the various national laboratories, particularly for plasma analysis on the Lawrence Livermore National Laboratory (LLNL) National Ignition Facility (NIF). Because X-ray photon flux measurement methods that can be accredited, i.e., traceable to NIST, have not been developed for sources operating in these energy ranges, NSTec, NIST, and the National Voluntary Accreditation Program (NVLAP) together have defined a path toward the development and validation of accredited metrology methods for X-ray energies. The methodology developed for the high energy X-ray (HEX) Laboratory was NSTecs starting point for X-ray metrology accreditation and will be the basis for the accredited processes in the other X-ray laboratories

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