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Title: The Mi Kasurement Challenge*
Author: C. K. S. Miller
Source: 1983 Measurement Science Conference
Year Published: 1983
Abstract: With the increasing proliferation of radiating sources to the electromagnetic (EM) environment and the increased use of semiconductor technology in consumer and industrial products, incidents of electromagnetic interference (EMI) to electronic products have increased. Current EMI measurement difficulties are reviewed and a description is given of the National Bureau of Standards (NBS) measurement research, both planned and in process.

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