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Title: Transient Lightning Protection For Electronic Measurement Devices
Author: Patrick S. Mccurdy
Source: 2002 American School of Gas Measurement Technology
Year Published: 2002
Abstract: Technology advances in the world of semiconductors and microprocessors are increasing at a breathtaking pace. The density of transistor population on integrated circuits has increased at a rate unimaginable just a few years ago. The advantages are many: faster data acquisition, real time control, and fully automated factories, to name a few.

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