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Title: Semiconductor Junction Temperature Measurement Techniques
Author: Bernard S. Siegal
Source: 1982 Measurement Science Conference
Year Published: 1982
Abstract: Semiconductor junction temperature directly impacts all areas of device performance. An understanding of the various measurement technique alternatives enables the selection of the one most appropriate for obtaining the data required. This paper provides a basic survey of the technique alternatives, pointing out the advantages and disadvantages of each. Recommendations are made as to which techniques are most suitable for specific applications.

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