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Title: The Effects Of IEEE-ST0 488 Interface Design Trade-Offs On Instrument Performance
Author: Norbert Laengrich
Source: 1983 Measurement Science Conference
Year Published: 1983
Abstract: This paper covets trade-offs of different IEEESTO- 488 interface designs from the test equipment users viewpoint. Brief descriptions are given of the interface circuit design using discreet components, software, and some popular LSI interface chips. These are followed by a review of how the designs effect the performance of the instruments when used in an ATE system. A sumnary lists several of the most popular LSI IEEE-STO-488 chip sets available.

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