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Title: Statistical Process Control (SPC) For Coordinate Measurement Machines. Using SPC And Monitoring Of Standard Artifacts To Determine And Control Measurement Uncertainty In A Controlled Environment
Author: Rudolph N. Escher, Jr.
Source: 2000 Measurement Science Conference
Year Published: 2000
Abstract: The application of process capability analysis, using designed experiments, and gage capability studies as they apply to coordinate measurement machine (CMM) uncertainty analysis and control will be demonstrated. The use of control standards in designed experiments, and the use of range charts and moving range charts to separate measurement error into its discrete components will be discussed. The method used to monitor and analyze the components of repeatability and reproducibility will be presented with specific emphasis on how to use control charts to determine and monitor CMM performance and capability, and stay within your uncertainty assumptions.

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