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Title: Advantages And Challenges Of Auto-Cal Instruments For Standards Labs
Author: William Bruce, Hal Chenhell, Warren Wong, Dave Agy, Wayne Goeke
Source: 1989 Measurement Science Conference
Year Published: 1989
Abstract: In the past few years several well known electronic instrument manufacturers in the DC & Low Frequency area have been designing internal calibration techniques into their latest instruments. This paper examines the benefits and drawbacks of these techniques, and discusses their impact on traceability.

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