Measurement Library

Measurement Science Conference Publications (1987)

Metrology Software Development Reouirements And Impacts
Author(s): David R. Workman
Abstract/Introduction:
Calibration automation software and systems have progressed from a development stage to an operational Metrology requirement. Along with this evolution comes the need for control of both system and technical aspects of the automation software. This report presents an overview of both perceived system requisites and problems which may be encountered in achieving the necessary controls.
Request Document From www.msc-conf.com
Email Reference
Document ID: 742837E9

Instrlment Intercomparison And Calibration
Author(s): Dennis Jackson
Abstract/Introduction:
It ia the intent of this paper to show a new analytical method for the calibration and intercomparison of measurement instruments. This method takes advantage of instrument tolerance information to make highly accurate Bayesian estimates of the systematic errors of all instruments used in the intercomparison process. Statistical inference techniques are developed to support calibration decisions.
Request Document From www.msc-conf.com
Email Reference
Document ID: C09B8793

Calibration Intrrvais For Multi-Function Trst Instrumrnts A Proposed Policy
Author(s): John A. Peeling
Abstract/Introduction:
Under a traditional policy, a multi-function/parameter test instrument is considered to be OOT (out-of-tolerance) if one or more of its parameters is OOT. A new policy is proposed under which the calibration interval of such instruments is considerably longer than under the traditional policy.
Request Document From www.msc-conf.com
Email Reference
Document ID: C2FA58B4

Session Iii-B - Measurement Error Analysis
Author(s): Mrs. Carroll Croarkin
Abstract/Introduction:
Mrs. Croarkin is Calibration Group Leader in the Statistical Engineering Division of the National Bureau of Standards where she is responsible for the design of calibration experiments and the application of statistical control techniques to measurement processes. She holds a B.A. degree in mathematics from Dunbarton College and an M.S. degree in mathematical statistics from the University of Maryland. Mrs. Croarkin is a member of the American Statisitcal Association.
Request Document From www.msc-conf.com
Email Reference
Document ID: B54805A2

Interpretation Of A Between-Time Component Of Error In Mass Measurements*
Author(s): Richard S. Davis
Abstract/Introduction:
Detection of a between-time component of error in a calibration process involves analysis of a lengthy record of data. An individual object or device which is being calibrated must be returned to the customer in a timely way. Therefore, evidence of a between-time component of error can only be inferred from studies of standards which are internal to the calibration facility. If study of internal standards reveals such an error component, it then becomes necessary to propagate this error to the reported calibration uncertainty. Because sophisticated calibrations usually involve measurement designs which are solved by least squares techniques, the propagation of a between-time error component is obscured.
Request Document From www.msc-conf.com
Email Reference
Document ID: 023EBE10

Graphical Displays For R&D In Tre RF/MICROWAVE Measuremint Industry
Author(s): Karen Kafadar
Abstract/Introduction:
The practice of data collection and analysis is becoming common in industry. Graphical displays are powerful tools in communicating information, but typically they are used for purposes of quality control in the manufacturing process. various displays can be used effectively in the R&D phase also. Examples of such displays and the effects of their uses are discussed inconnection with statistical problems arising in the RF/Microwave measurement industry.
Request Document From www.msc-conf.com
Email Reference
Document ID: 2F726EAE

Equipment Management Through Microcomputers
Author(s): Charles T. Van Winkle
Abstract/Introduction:
Equipment management, assisted by computer systems, has been part of the essential operation of most large companies for a number of years. In recent years, calibration scheduling and recall programs have been added as a means of more accurately tracking calibrateable test equipment. To date, most equipment management systems on mainframe computer systems have been developed with in-house programming support. Many times the needs of the Metrology Department are not met, due to low priority, lack of space, or lack of understanding by the programmers of metrology needs. Additionally, many smaller companies without in-house computer resources must rely on purchased time from outside sources.
Request Document From www.msc-conf.com
Email Reference
Document ID: D446A741

Procedure Development And Tool-Proofing
Author(s): D. W. Bradford
Abstract/Introduction:
Most companies often fail to provide adequate procedures to assure communication and control. Training and improvement of procedure-writers is generally haphazard, even though procedure improvements reduce both visible and hidden costs. Techniques for procedure development, tool-proofing, and clarification, such as flowcharting, are available, but seldom used.
Request Document From www.msc-conf.com
Email Reference
Document ID: F29B7D32

Accelerometer Calibration At Twenty National Laboratories
Author(s): M.R. Serbyn
Abstract/Introduction:
A worldwide inter-laboratory test to compare calibration results obtained on primary-standard accelerometers of the back-to-back type has been in progress for three years. The paper describes the calibration capabilities of the participating laboratories, explains the mechanics of the round robin, and presents some results of preliminary statistical analyses of the data base.
Request Document From www.msc-conf.com
Email Reference
Document ID: 2A8C4FAE

Shock Calibration Of Accelerometers To 200 000 Gs Using The Hopkinson Bar
Author(s): Robert Sill
Abstract/Introduction:
Shock accelerometers can be calibrated with very large amplitude impacts by measuring longitudinal strain of a slender bar. This paper describes the Endevco Model 2973 Shock Motion Accelerometer Calibrator (SMAC) and the theory, technique.)
Request Document From www.msc-conf.com
Email Reference
Document ID: 681B4910

Metrology Challenges Of The Strategic Defense Initiative*
Author(s): Brian C. Belanger
Abstract/Introduction:
As the nations standards laboratory, the National Bureau of Standards (NBS) has a responsibility to monitor new technological developments in order to identify emerging requirements for national measurement reference standards and measurement services. During the past two years, NBS has been working with the Strategic Defense Initiative Office (SDIO), the Military Services, and industrial contractors to determine what new or improved measurement capabilities will be required to support the SDI. This paper provides an indication of the metrology challenges in selected technical areas by citing several specific examples.
Request Document From www.msc-conf.com
Email Reference
Document ID: EDF00FFA

Accelerometer Verification And Calibration Measurements Using A 2-CHANNEL Fft Analyzer Assisted By A Personal Computer For Data Handling
Author(s): Ernst Schonthal
Abstract/Introduction:
The requirements for better accuracy in accelerometer calihrntfon as well as documentation of the accelerometer performance over a given frequency range have increased during the past years.
Request Document From www.msc-conf.com
Email Reference
Document ID: A863D743

Two Pressure Humidity Generation And Calibration Systems
Author(s): Brad Bennewitz
Abstract/Introduction:
Of all the factors considered in relative humidity measqrement, the most important, and that which most often is given little attention, is the calibration equipment. In todays research and metrology environment, reference instrumentation must be easy to install, operate, and maintain. This instrumentation must also provide accurate and repeatable data. It is the purpose of this paper to provide details on construction, performance, and operation of various commercially available Two Pressure Humidity Generating System
Request Document From www.msc-conf.com
Email Reference
Document ID: 96F350A9

Multiplying And Dividing Techniques For Improved Definition Of Pressure In The Extreme Ranges
Author(s): Martin J. Girard, Pierre R. Delajoud
Abstract/Introduction:
Many pressure calibration laboratories need to maintain capability in a range from less than IkPa (O.lSpsi) to 1 OOOMPa (145 OOOpsi). Various manufacturers have adapted basic piston gauge technology to cover segments of this wide range with separate and distinct instruments. Modern high quality piston gauges are extremely reliable and easy to use in a broad mid-range from roughly O.lMPa to as high as 500MPa.
Request Document From www.msc-conf.com
Email Reference
Document ID: A7C28A0A

Fine-Tuning Your Deadweight Gage Pressure Calibrations
Author(s): Donald B. Francis
Abstract/Introduction:
Deadweight gages (DWGs), also called deadweight testers, pressure balances, piston gages, OK piston manometers provide primary and working pressure standards in metrology laboratories. They are also used as transfer standards for calibrating field instruments.
Request Document From www.msc-conf.com
Email Reference
Document ID: 56E404A1

Submicrometer Optical And Sem Linewidth Metrology*
Author(s): Robert D. Larrabee
Abstract/Introduction:
The feature sizes on modern integrated circuits are presently taxing the ability of,visiblelight optical systems to perform the necessary dimensional measurements required during their production. With the shrinking of feature dimensions to the micrometer and submicrometer level, diffraction and finite wavelength become the limitations of existing optical systems. In an effort to overcome these limitations, metrology systems based on the scanning electron microscope (SEM) h ave appeared and are often assumed to be the panacea of all the problems and the limitations of existing optical systems. In response to the application of the SEM to these problems, new optical. systems have appeared including ultraviolet and laser scanning systems.
Request Document From www.msc-conf.com
Email Reference
Document ID: 37705612

Evaluaxon Of An Inter-Laboratory Gage Block Round Robin
Author(s): Jack Edison
Abstract/Introduction:
This paper is intented to describe and evaluate results of a gage block round robin conducted by several companies in California between June 1983 and June 1986.
Request Document From www.msc-conf.com
Email Reference
Document ID: 3A06CFDE

Computer Aided Accuracy: The Next Step In The Quest For Accuracy
Author(s): Kenneth L. Sheehan
Abstract/Introduction:
In this paper, the fundamental sources of CMM inaccuracy are identified. The evolution of correction methods is traced. The basis of CAA, the present state-of-the-art, is explained along with limitations and possible future developments.
Request Document From www.msc-conf.com
Email Reference
Document ID: CE1E50D2

Volumetric Accuracy Determination Using Non-Traditional Devices
Author(s): Benjamin R. Taylor
Abstract/Introduction:
Since the first 3-D Coordinate Measurement Machine was developed over twenty years ago, various devices and techniques have been used to determine their volumetric measuring accuracy. Early machines used calibrated length standards TV determine their linear measuring accuracy. Indicating devices located on the measuring arm, were nulled against each end of the len&h standard and the measured value was compared against the calibrated value. This, of course, was very time consuming and required a high degree of stability in the artifacts used so that their known length would be maintained. Also, this did not uncover many of the 3D errors such as axis squareness, straightness, or roll.
Request Document From www.msc-conf.com
Email Reference
Document ID: 63D0781D

The Application Of Low Noise Switches For Automating Precision Measurements
Author(s): James Marshall
Abstract/Introduction:
A switching system which has very low thermal EMFs (less than 50 nanovolts) and protection systems which allow the automating of standard cell comparisons was described at the 1984 Measurement Science Conference. This same switch is being used to automate other critical measurements in the standards laboratory such as the comparison between 10 volt solid state voltage references and standard cells, standard resistance comparisons and temperature calibrations. This paper will review several of these applications showing the setups used and typical results that are obtained.
Request Document From www.msc-conf.com
Email Reference
Document ID: C4BB5D97

The Nbs Ohm Past - Present - Future
Author(s): Ronald F. Dziuba
Abstract/Introduction:
A brief history is given of the NBS Ohm commencing from the establishment of the NBS in 1901 to the present. It includes a description of the resistance standards and measurement methods used to maintain the NBS Ohm during its 85-year history. Indications of the drift of the NBS Ohm based on absoluteohm determinations and quantized-Hall effect measurements are presented. The results of these measurements may lead to an adjustment of the value of the NBS Ohm in 1990.
Request Document From www.msc-conf.com
Email Reference
Document ID: F3AACBCD

Performance Of Load Cells As Transfer Standards For Force Calibrations.
Author(s): L. K. Rangan, D. W. Harry
Abstract/Introduction:
Using load cells as transfer standards, nominally equal large weights (force standards) at Lockheed Missiles and Space Companys Physical Dimensional Standards Laboratory (PDSL) have been mutually intercompared and compared with a similar weight at the National Bureau of Standards (NBS), under carefully controlled conditions. The experiments and the results are described in this paper.
Request Document From www.msc-conf.com
Email Reference
Document ID: 36B128A7

Biographical Information
Author(s): Ernest L. Garner, Barry A. Bell, T. Michael Souders, John D. Ramboz
Abstract/Introduction:
[Abstract Not Available]
Request Document From www.msc-conf.com
Email Reference
Document ID: E42D5AD0

Research Areas To Address ELECTRICAL/ELECTRONIC Measurement Needs Below 1OMHZ
Author(s): Barry A. Bell
Abstract/Introduction:
Several technical areas are actively being worked on in the Electrosystems Division which have been identified by means of a recent survey conducted to assess the important de/low frequency, electrical/electronic measurement needs up to 10 MHzl. Some of these areas, such as precision ac voltage metrology, have been the subject of continuing research, going back to the pioneering work of F. Hermach and others at NBS. Other areas, such as automated testing metrology and conducted EM1 metrology, are relatively new subjects of research at NBS. The Electronic Instrumentation and Metrology Group of the Electrosystems Division has been pursuing a new program in the general area of dynamic electrical measurements and standards in support of modern electronic instrumentation2. This presentation will provide an overview of some of the recent efforts to address the measurement problems associated with these technical areas, and to discuss other possible areas of needed research identified by the survey
Request Document From www.msc-conf.com
Email Reference
Document ID: AD7DC9FB

Nbs Calibration Services And Research Programs For Electrical Power And Energy And Related Quantities
Author(s): John Ramboz
Abstract/Introduction:
The Applied Electrical Measurements Group of the Electrosystems Division has the responsibilities of maintenance and dissemination of the electrical quantities of power and energy. In addition, routine calibration services are offered for current and voltage transformers as well as for high-voltage capacitors and dividers.l Special calibration services are available for electric field measuring instruments2 and very high-current sensors.3 The presentation will discuss these services, with special emphasis on recent developments. Research related to high-voltage breakdown of dielectrics, pulsed-power measurement, and electro-optic sensors will be briefly presented.4-71
Request Document From www.msc-conf.com
Email Reference
Document ID: DB05FB3E

Standards And Test Methods For Waveform Recorders And Calibration Strategies For Complex Electronic Systems
Author(s): T. m. Souders
Abstract/Introduction:
For a number of years, NBS has been engaged in developing standards and test methods for high performance data converters, including waveform recorders. In 1981, a new NBS calibration service for A/D and D/A converters was established l. With this service, customers can have offset, gain, and - integral and differential linearity errors measured with accuracies to a few ppm, for converters having up to 18 bits of resolution. By 1984, the service was augmented (as a special test) with the capability to perform full dynamic testing of A/D converters, in which the converters are dynamically exercised with input steps as they are in actual use 2.
Request Document From www.msc-conf.com
Email Reference
Document ID: 07C56CAB

Precision Measurement Of Rms Voltages By Digital Techniques
Author(s): Gary m. Renaud
Abstract/Introduction:
Currently, true RMS AC voltage and current measurements are made using some type of thermal transfer standard. With recent advances in digital circuitry, it is possible to measure RMS values by digitizing the waveform and computing the RMS value from the samples and have the result at an accuracy rivaling that of thermal devices.
Request Document From www.msc-conf.com
Email Reference
Document ID: 40CCA9AC

A Fully Automated Digital AC/DC Transfer Standard
Author(s): R. G. Robertson
Abstract/Introduction:
An autoranging microprocessor based AC/DC transfer standard is described. The transfer element is a differential multijunction thermal converter. Software compensation for minimizing residual AC/DC transfer error is provided over the frequency range from 40 Hz to 1 Mhz (plus DC) and over the voltage range from 0.1 to 1000 volts rms. Achievable accuracy is in the order of 20 ppln to 500 ppm depending on the voltage and frequency.
Request Document From www.msc-conf.com
Email Reference
Document ID: F81A9AF8

Coaxial Connectors Through 50 Ghz: The Evolutionto Smaller Geometries, Susceptabilityto DAMAGE,AND A New Approach To Maintainability
Author(s): Ron Ramirez
Abstract/Introduction:
Since the beginning of World War II, there has been an ongoin evolution in connectortechnology for %a ndling RF energy. Early in the 1940s. it appears that advances in RF cable technology had more significant influences in RF connector design than considerations for bandwidth. Rigid coax transmission lines were commonplace. In 1943 polyethylene, a superior dielectric developed in the U.K., was introduced, spawning a new flexible RF cable industry.
Request Document From www.msc-conf.com
Email Reference
Document ID: 24D05595

Millimeter Wave Sources
Author(s): Rolf Dalichow, Mohamed Sayed
Abstract/Introduction:
AN OVERVIEW OF THE VARIOUS METHODS OF GENERATING SWEPT MM-WAVE FREQUENCIES IS PRESENTED.
Request Document From www.msc-conf.com
Email Reference
Document ID: D7B4102E

The Metrology Impact Of New Complex Modulation Tes Equipment Of Traceability Requirements
Author(s): David F. Buckley
Abstract/Introduction:
THE JANUARY 1986 INTRODUCTION OF AN ARBITRARY WAVEFORCE SYNTHESIZER WITH A 125 MEGA-SAMPLE RATE AND 12 BIT RESOLUTION WILL CREATE SOME DIFFICULTY FOR METROLOGY ENGINEERS WORKING TO FIND REFERENCE STANDARDS FOR DYNAMIC SIGNALS.
Request Document From www.msc-conf.com
Email Reference
Document ID: 25983E3B

Mean-Squared Error As A Criterion For Managing A Measurement System
Author(s): Victor W. Lowe
Abstract/Introduction:
Many of the decisions facing the managers of measurement systems are special cases of the general problem of choosing between two competing measurement systems. The measurement system that does the best job of measuring a particular parameter is preferred over the system that does not do as well. But what is best and how is it measured? This paper explores those questions and demonstrates that many of the common decision rules based on accuracy and/or precision are suboptimal and can lead to inadvertently choosing measurement systems with undesirable properties
Request Document From www.msc-conf.com
Email Reference
Document ID: 121877FF

A Metrology Approach To Hardness Standards
Author(s): Terrelle J. Wilson
Abstract/Introduction:
The need for traceability to a national or industrial source is a fundamental requirement for metrology laboratories. As industry attempts to standardize a material, process or parameter, problems can be encountered which affect traceability. This paper will show the steps taken by MMDA Metrology to deal with this subject as it relates to Rockwell and Microhardness standards.
Request Document From www.msc-conf.com
Email Reference
Document ID: A00D0513

An Applicationo F Processm Etrology To The Automaticca Librationo F Instruments
Author(s): Les Huntley
Abstract/Introduction:
It has been suggested that Process Metrology should provide answers to three questions Is this process in control?, Is it controlled at the desired setpoint?, and Is the control point stable with time? The first question can be answered for some production processes by providing check standards as the means for demonstrating process control. The remaining two questions can be answered by measurements made upon the products of the process. If the measurements are made by the metrology department (the department charged with maintaining traceability to national standards) then the process, including any check standards and measuring instruments involved in the process, may be certified on the basis of these measurements.
Request Document From www.msc-conf.com
Email Reference
Document ID: CF1F6F8F

Automating Standard Cell Calibrations Rockwell Metrologys Approach
Author(s): W. Ronald Coff, J. Miriah Arther
Abstract/Introduction:
,Rockwell International Corporations Metrology Department in Anaheim, California initiated computer-aided standard cell data reduction as early as 1968. Still, the intercomparison measurements were performed manually and data had to be entered into the computer. It wasnt until 1983 that appropriate cormnercial instrumentation, the capital funds to acquire it, and personnel were available to implement an automated standard cell measurement system.
Request Document From www.msc-conf.com
Email Reference
Document ID: F676C29B

Evaluation Of Uncertainties Associated With Use Of The Power Equation
Author(s): L. R. Amaro, A. m. Quaas
Abstract/Introduction:
Over the past 15 years Rockwell International Corporations Metrology Laboratory in Anaheim, California has utilized the Power Equation concept to perform automated state-of-the-art Effective Efficiency (EE) RF power calibration measurements. These power calibration measurements contain various components of systematic and random error. Recently in an effort to provide users with Calibration Factor (CF) data, an attempt has been made to thoroughly define the errors in this measurement. This paper describes the efforts to quantify these errors and the results of tests to-date.
Request Document From www.msc-conf.com
Email Reference
Document ID: 9B00C89E

Developing Calibration Procedures For Ate
Author(s): Christopher L. Wagner, Keith E. Arnold
Abstract/Introduction:
The most effective calibration of an ATE system is through an automated on-site, system-oriented approach. For this approach to be effective, written calibration instructions must be clear, concise, complete and easy to follow. Further, the calibration software must be flexible, user-friendly and easy to revise, and must handle all combinations of user and test equipment feedback without deviating from its intended function.
Request Document From www.msc-conf.com
Email Reference
Document ID: 0A8F2878

Computerization Of The Inspection Process In An R&D Environment
Author(s): Audrey K. Hamori
Abstract/Introduction:
Mechanical Inspection is a vital part of any development process. To keep pace with the expanding field of computerized design aids, The Charles Stark Draper Laboratory, Inc. is computerizing the inspection process for its Mechanical Inspection Laboratory. The Computerized Inspection System (CIS) will increase productivity and reliability in the Inspection Laboratory and enable designers and quality assurance engineers to perform on-line analyses of inspection data.
Request Document From www.msc-conf.com
Email Reference
Document ID: 81F80652


Copyright © 2017