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Title: Testing The Wafer V-Cone Flowmeters In Accordance With API 22 Testing Protocol Section 2 - Differential Pressure Flow Measurement Devices In The CEESI Colorado Test Facility
Author: Dr R.J.W.Peters, Casey Hodges, Steve Caldwell
Source: 2006 International Symposium on Fluid Flow Measurement
Year Published: 2006
Abstract: The paper describes the testing of the Wafer V-Cone Meters in accordance with the new API 22.2 Testing Protocol for Differential Pressure Flow Measurement Devices in the Colorado Test Facility. The use of this new API standard and some of the points which had to be addressed in order to implement it are recorded. The results of testing 2 and 4 Wafer V-Cone meters in gas will be presented. The new nonstandard testing requirements in the API 22.2 will be discussed. The conclusions reached were: the results verify the conditioning effect of the V-Cone as it meters the fluid API 22.2 tests the claims of the manufacturer of the meter in a more demanding manner than API 5.7. The results of the Wafer V-Cone Testing Uncertainty are discussed.




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