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Title: The Developing National Measurement System For Length In The Micrometer And Sub-Micrometer Range
Author: Russell D. Young
Source: 1978 Measurement Science Conference
Year Published: 1978
Abstract: Recent technological shifts toward microcircuits and other microtechnologies have generated unmet demands for length measurements in the micrometer and submicrometer range. The National Bureau of Standards is developing the measurement techniques and physical standards to provide the basis for extending the National Measurement System for Length to the micrometer range.

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