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Title: The Impact Of Final Test On Outgoing QUC)LITY
Author: Lowell D. Snapp
Source: 1989 Measurement Science Conference
Year Published: 1989
Abstract: To achieve quality levels of less than 102 defective parts per million (Dppn) shipped, required from world class microelectronics suppliers, guidelines rmst be established to insure adequate defect screening at final test